[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - Kyoto, Japan (June 16-18, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - A sensitivity and linearity improvement of a 100 dB dynamic range CMOS image sensor using a lateral overflow integration capacitor

Akahane, N.; Sugawa, S.; Adachi, S.; Mori, K.; Ishiuchi, T.; Mizobuchi, K. . (2005). [IEEE Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - Kyoto, Japan (June 16-18, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - A sensitivity and linearity improvement of a 100 dB dynamic range CMOS image sensor using a lateral overflow integration capacitor. , (), 62–65. doi:10.1109/vlsic.2005.1469334

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